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dc.contributor.authorT. Sareeinen_US
dc.contributor.authorM. Unruanen_US
dc.contributor.authorA. Ngamjarurojanaen_US
dc.contributor.authorS. Jiansirisomboonen_US
dc.contributor.authorA. Watcharapasornen_US
dc.contributor.authorR. Yimnirunen_US
dc.date.accessioned2018-09-10T03:25:14Z-
dc.date.available2018-09-10T03:25:14Z-
dc.date.issued2009-04-13en_US
dc.identifier.issn03759601en_US
dc.identifier.other2-s2.0-62649163672en_US
dc.identifier.other10.1016/j.physleta.2009.02.065en_US
dc.identifier.urihttps://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=62649163672&origin=inwarden_US
dc.identifier.urihttp://cmuir.cmu.ac.th/jspui/handle/6653943832/59951-
dc.description.abstractThe influences of compressive stress and aging on dielectric properties of undoped and Fe-doped sodium bismuth titanate (NBT) ceramics were investigated. The dielectric properties were decreased significantly with the compressive stress applied parallel to the electric field direction, while the changes were reversed with the stress applied perpendicularly. In addition, lower changes of the dielectric properties with stress were observed in Fe-NBT ceramics, likely caused by an enhanced relaxor characteristic with the acceptor doping, which also reduced the aging rate in the ceramics. Finally, the aging behavior of the NBT and Fe-NBT ceramics followed the slightly stretched exponential law, and the aging rate in both ceramics was found to decrease with frequency, a result of the pinning of the polarization components. These observations clearly confirmed the role of the acceptor dopant in enhancing the relaxor ferroelectric characteristics in the NBT-based ceramics. © 2009 Elsevier B.V. All rights reserved.en_US
dc.subjectPhysics and Astronomyen_US
dc.titleInfluences of compressive stress and aging on dielectric properties of sodium bismuth titanate ceramicsen_US
dc.typeJournalen_US
article.title.sourcetitlePhysics Letters, Section A: General, Atomic and Solid State Physicsen_US
article.volume373en_US
article.stream.affiliationsChiang Mai Universityen_US
Appears in Collections:CMUL: Journal Articles

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